| PART |
Description |
Maker |
| GET-30497 |
Qualification Test Results
|
CEL
|
| 1-1461491-0 2-1461491-0 3-1461491-0 1461491-1 1-14 |
Qualification Test Report
|
Tyco Electronics
|
| GET-30593 |
Qualification Test Report on NE681XX
|
California Eastern Labs
|
| GET-BC-0004 |
Qualification Test Report on NE292
|
California Eastern Laboratories
|
| SGA-8343X |
Reliability Qualification Report 可靠性鉴定报
|
STANFORD[Stanford Microdevices]
|
| IRF830A IRF830APBF |
Low Gate Charge Qg Results in Simple Drive Requirement
|
Kersemi Electronic Co., Ltd...
|
| 6249-12-0 6249-24-0 6249-48-0 6249-24-2 6249-12-2 |
Test Clip To Multi-Stacking Banana Plug Test Lead
|
Pomona Electronics
|
| 5523 3781 |
Connector assemblies, Hooks Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
Minigrabber Test Clip Patch Cord
|
Pomona Electronics
|
| IRLML6346TRPBF |
Industry-standard SOT-23 Package MSL1, Consumer Qualification Multi-vendor compatibility
|
TY Semiconductor Co., Ltd
|
| AT17LV65 |
65/128/256/512K-bit and 1/2/4M-bit FPGA Configurator EEPROM (3.3V and 5V). Obtain the qualification
|
Atmel Corp
|
| EFM32TG840F32-QFN64 EFM32TG232F8-QFP64 EFM32TG110F |
Updated specifications based on the results of additional silicon characterization.
|
Silicon Laboratories
|
| 6470 |
Test Probe; Leaded Process Compatible:Yes; Peak Reflow Compatible (260 C):Yes RoHS Compliant: Yes INTERCONNECTION DEVICE
SMD Microtip Test Probe Set
|
Pomona Electronics
|
